GEM/TPC Tracking analysis #3

April 2002

The P10 and ArCO2 data from Oct-Dec 2001 are reanalyzed and compared with simulated data from the gemsimulator package. The new analysis includes a study of a new track fitting algorithm.

Fitting algorithms

The model that describes charge deposition on the pads has not changed since the original analysis. A change has been made in the way that that information is used.

The original fitting algorithm (Fit 1) was based on a naive chi**2 calculated by comparing the observed and model charge fractions in a row, and the standard deviation in the model fraction was fixed to be 0.05. There are two problems with this function: the standard deviations of model fractions depends on the primary electron statistics; the fractions in a row with only a few pads hit are highly (anti) correlated.

A new fitting algorithm (Fit 3) assumes that repeated measurements of charge fractions (for fixed track parameters) would yield a multinomial distribution, as defined by the primary electron statistics. Of course, the primary electrons are not directly counted... but we can assume that the fluctuations due to the amplification process and noise sources are small compared to the multinomial fluctuations. (This should be a good approximation given the rather large gains used). This method correctly accounts for correlations in a simple fashion. A small uniform probability for noise to occur is included, to avoid instability. The contribution to the likelihood for a simple multinomial distribution (for a single pad row) is given by:

npad
[Sum] n log(p ) + constant
i = 1  i     i

Where n_i is the number of primary electrons "associated" with a pad, and p_i is the model probability for a primary electron to be associated with that pad. To estimate n_i, the GEM system gain is used. With the noise term added, this changes to:
 

            (  p + p        )
npad        (   i   noise   )
[Sum]  n log(---------------)    + constant
i = 1   i   (1 + npad p     )
            (          noise)

In the following, plots are shown comparing: (Data, MC) x (P10, ArCO2) x (Fit1, Fit3).

Monte Carlo Samples

The following data sets were generated for ArC02 conditions: 100 events each with z0 = 80 mm, psi = 0 rad.
 
Run # x0 (mm) phi (rad)
101 0. 0.
102 0.3 0.
103 0.6 0.
104 0.9 0.
105 1.2 0.
111 0. 0.05
112 0.3 0.05
113 0.6 0.05
114 0.9 0.05
115 1.2 0.05
121 0. 0.15
122 0.3 0.15
123 0.6 0.15
124 0.9 0.15
125 1.2 0.15

A sample of 2000 events (run 100) and 10000 events (run 110) was also generated with x0, phi, z0, and psi randomly selected. A corresponding set of runs were performed using P10 conditions using the run numbers in the 200's. The two .gem files can be found here: labArCO2.gem and labP10.gem. Two of the .gms files are here: run100.gmc and run200.gmc.

General Event Properties

Timing properties:

The time at which the signal rises to 50% of the peak (tr) is used to define the z coordinate of the measurement. This figure compares the distributions for this variable. The MC samples (run 100 and 200) does not describe this distribution well.

The rise time of the pulse depends, in principle, on the preamp specifications, on the drift velocity in the induction gap, the longitudinal extent of the charge cloud. One way to quantify the rise time is to look at the time required for the signal to rise from 50% (tr) to 100% (tp : peak time). The difference of these two times a function of tr is shown in this figure. To reduce the effect of induced pulses, the plot only includes pulses with amplitude at least 20 ADC counts. The data shows a much larger effect on the drift length than the MC. This may imply that longitudinal diffusion is not properly accounted for, but requires further study. Note that Magboltz calculations indicate that ArCO2 (90:10) should have less longitudinal diffusion than P10.

The full width half maximum of the pulses are shown here (again only those with amplitude of at least 20 ADC counts).  Once again, the simulation is seen to be quite different from reality. A more sophisticated treatment of the time structure of the signals appears to be necessary.

The time structure is presently simulated in a simple way. The direct charge signal due to a single electron moving in the induction gap is assumed to follow a linear ramp function. To construct a signal due to a cloud of electrons the ramp function is convoluted with a gaussian, the standard deviation given by the standard deviation of arrival times at the pad. The calculations for this are shown here. The signals are then passed through a filter that simulates the rise time and fall times of the preamplifier electronics.

Amplitude properties:

The total charge collected by each row is shown here, for events which are fully contained within the pad geometry. The simulated distributions are reasonable approximations of the data.

Tracking Studies

The tracking coordinate system, the same as used in the two previous analyses, is shown here. The tracking is performed in the y-z and x-y planes separately. The y-z tracking relies on the time structure of the signals, which are not yet well simulated. The x-y tracking relies on the amplitudes of the pulses, which appear to be better simulated.

y-z tracking

There has been no change to the tracking in the y-z plane. It was previously noted (in analysis 1 and 2) that the arrival time, as defined by tr - the time at which the pulse reaches 50% of its maximum, has a strong dependence on the amplitude of the pulses. Not surprisingly the effect is not reproduced in the current simulation, as shown in this figure. The plots show how much earlier the low amplitude pulses arrive as compared to the larger amplitude pulses (see previous analyses for more detailed description).

The resolution from fits to data was estimated by comparing the z0 estimate from 1 row to that with the 4 other rows. With simulated data, one can check that this procedure gives reasonable results. Since the simulated samples do not have the systematic effect discussed in the previous paragraph, they have better z resolution than the data samples.

The ntuples have the following variables relevant to y-z tracking:
 
variable description
zb the z0 estimate from a fit to all 5 rows in y-z (in ns)
zbxr(irow) the z0 estimate from a fit to all rows except irow (in ns)
zbr(irow) the z0 estimate from irow, fixing the angle psi from the zbxr fit (in ns)
z0mc the true z0 for MC samples (in mm)

The following table compares various resolution estimates (in mm) from data and simulated samples:
 
resolution estimate P10 data P10 MC (run 200) ArCO2 data ArCO2 MC (run 100) comments
sigma of fit to (zbr-zbxr) (excluding tails) 0.79 0.18 0.23 0.04 to translate to single row resolution, divide by sqrt(1.25)
as above,  limited to first 20 mm of drift 0.74 +/- 0.06 0.18 0.11 0.04
sigma of fit to (zb-z0mc) (excluding tails) 0.06 0.02 to translate to single row resolution multiply by sqrt(5) ?
sigma of fit to (zbr-z0mc) (excluding tails) 0.14 0.03 single row resolution assuming fixed angle, psi

Although the MC samples do not reproduce the data resolutions, the MC samples do indicate that the procedure for estimating the resolution works reasonably well.

x-y tracking

There are now two fitting functions applied, the original (Fit 1) and a new one (Fit 3) based on the multinomial distribution. See discussion at top of this write-up for more details.

The fitted values for sigma (the transverse size of the line charge) is shown for Fit 1 and Fit 3, and the data and MC are in reasonable agreement. The peaks at small values of sigma are due to some fitting pathologies, when there is little information to determine the sigma. These occur more frequently for ArCO2 data where the transverse diffusion is much less. There are fewer problematic fits when Fit 3 is applied, as compared to Fit 1.

The slope of sigma**2 vs drift time gives estimates of the transverse diffusion in the drift volume, the intercept gives a measure of the diffusion in the GEM itself.
 
P10 data Fit 1 P10 MC Fit 1 P10 data Fit 3 P10 MC Fit 3 ArCO2 data Fit 1 ArCO2 MC Fit 1 ArCO2 data Fit 3 ArCO2 MC Fit 3
A0 (mm^2) -1.74 -1.70 -1.59 -1.45 0.143 0.103 0.095 0.086
A1 (mm^2/ns) 0.00101 0.00102 0.00091 0.00086 0.31E-04 0.31E-04 0.34E-04 0.25E-04
D (microns/sqrt(cm)) 450 450 430 410 190 190 190 170
D0 (microns) 530 290 480 230 450 400 400 360

To estimate the diffusion constant, D, and the diffusion for zero drift, D0, it was assumed that the drift velocity for P10 and ArCO2 was 50 and 9 microns/ns. The time-zero (ie. zero drift) of the data is about 2000 ns, and for the MC is about 1750. The lack of precise knowledge of T0, results in large uncertainty in D0.

The actual diffusion constants used in the MC generation was 450 and 190 microns/sqrt(cm) for P10 and ArCO2 respectively. It appears that Fit 3 gives an estimate for the diffusion constant that is biased toward smaller values by about 5-10%. The transverse diffusion constant in the transfer and induction gaps (a total of 7.7 mm) was set to 450 and 400 microns/sqrt(cm). The latter value was inflated, from the Magboltz value of about 200 microns/sqrt(cm), to bring the observed diffusion in the GEM for ArCO2 to be closer to observed value.

Fit 1 does not include data from pads without signals above thresholds in calculating its chi**2. Fit 3 includes the information from all pads. Pad signals must be above a certain threshold (given by the parameter anmin) for them to included as a real signal in the pad fraction calculations. Pads with signals below the threshold level are assigned to have zero signal. The fact that Fit 3 does not account for the threshold requirement may explain why it underestimates the diffusion constant.

In analyses 1 and 2 estimates the x0 resolution in data were done by fitting x0,phi, and sigma with 4 rows and comparing the x0 value to a "fit" to x0 with the other row, keeping phi and sigma fixed at the result from the 4 row fit. With the MC data one can now check to see if that procedure gives a reasonable estimate for the single row position resolution.

The ntuples have the following variables relevant to x-y tracking:
 
variable description
b the x0 estimate from a fit to all 5 rows in xy (in mm)
be the estimated uncertainty in b estimate (from delta chi**2 or Log Likelihood)
bxr(irow) the x0 estimate from a fit to all rows except irow (in mm)
br(irow) the x0 estimate from irow, fixing the angle phi and sigma  from the bxr fit (in mm)
bxsr(irow) the x0 estimate from a fit to x0 and phi using all rows except irow; sigma is calculated from drift distance
bsr(irow) the x0 estimate from irow, fixing the angle phi and sigma from the bxsr fit
x0mc the true x0 for MC samples (in mm)

Fit 1:
resolution estimator P10 data P10 MC ArCO2 data ArCO2 MC comments
sigma of fit to (br - bxr) (excluding tails) 400 310  -   - - : not gaussian
as above, limited to first 20 mm of drift 250 190  -   -
sigma of fit to (bsr-bxsr) (excluding tails) 400 310 320 230
as above limited to first 20 mm of drift 250 230 220  - - : not gaussian
sigma of fit to (b-x0mc) 90 60 multiply by sqrt(5) to get single row resolution
as above limited to first 20 mm of drift 50 50
sigma of fit to (br-x0mc) 260 190
as above limited to first 20 mm of drift 200 170
sigma of fit to (bsr-x0mc) 270 180
as above limited to first 20 mm of drift 170 130
average be 70 50  
as above limited to first 20 mm of drift 50 50 * * : not well behaved
sigma of fit to (b-x0mc)/be 1.6 1.5 error is underestimated

Fit 3:
resolution estimator P10 data P10 MC ArCO2 data ArCO2 MC comments
sigma of fit to (br - bxr) (excluding tails) 400 290  -  - divide by sqrt(1.25) to get single row resolution
as above, limited to first 20 mm of drift 250 190  -  - "
sigma of fit to (bsr-bxsr) (excluding tails) 400 290  270 220 "
as above limited to first 20 mm of drift 250 200  240 180 * " * not gaussian
sigma of fit to (b-x0mc) (excluding tails) 80 60 multiply by sqrt(5) to get single row resolution
as above limited to first 20 mm of drift 50 50 multiply by sqrt(5) -> 110 microns
sigma of fit to (br-x0mc) 260 180
as above limited to first 20 mm of drift 200 150 *
sigma of fit to (bsr-x0mc) 250 160
as above limited to first 20 mm of drift 170 130 *
average be 95 90 70 60
as above limited to first 20 mm of drift 65 60 60 60
sigma of fit to (b-x0mc)/be 1.1 1.0 error is reasonably well estimated

The following summarizes the important points from the study above:

The remainder of this study uses only Fit 3.

The MC samples appear to simulate the x-resolution properties fairly well. This figure compares the distributions of (bsr-bxsr) for data(red) and MC(black) for Fit 3.

The MC samples confirm that the simple linear centroid method does much worse in determining the x coordinate for each row. This figure compares the residual for the centroid method (ntuple variable bl, in red) with the bsr method (in black) for the ArCO2 sample with z < 20 mm.

The uncertainties in the phi angle (phie) from the data and MC fits are 14 and 13 mrad, respectively.

Poor track fits
The second analysis (CO2 data) showed that the poor track fits that resulted in anomalously low estimates for sigma (the transverse size of the line charge) were associated with certain phi and x0 values. The frequency of these poor fits has been reduced with Fit 3, but not eliminated. The MC sample reproduces this behavior, as shown in this figure for CO2 data and this figure for CO2 MC. Therefore the MC samples will be useful to study this problem further.

The poor track fits occur more frequently in the CO2 data, because there are more pad rows with only a single hit, due to the lower transverse diffusion. The MC does not simulate this aspect very well: This figure compares the fraction of rows with only 1 pad hit for data and MC and for the two gas mixtures.

Track angle effect
The previous analyses saw large track angle effects, but with limited statistics. To see if the MC sample reproduces the effect, the same analysis is performed, this time with Fit 3, in which the standard deviations of the bsr-bxsr distributions are compared for different ranges of phi. This figure shows the distributions for z < 10 mm, and this figure for 10 < z < 30 mm. The upper rows are data and the lower rows MC. The fit results for the standard deviations (in microns) are shown in the tables below:

z < 10 mm
0 < phi < 0.05 0.05 < phi < 0.15 0.15 < phi < 0.35
Data 211 +/- 28 229 +/- 18 266 +/- 28
MC 217 +/- 17 221 +/- 15 255 +/- 15

10 < z < 30 mm
0 < phi < 0.05 0.05 < phi < 0.15 0.15 < phi < 0.35
Data 175 +/- 10 219 +/- 8 330 +/- 22
MC 176 +/- 8 188 +/- 7 228 +/- 9

The MC samples follow the same pattern as the data, showing an increase in the standard deviations for larger track angles. The MC only shows significant increase for the largest phi bin.

Using the MC samples, one can directly examine the residual distribution for x0 for different phi bins. This is shown in this figure for ArCO2 and this figure for P10, for drift distances less than 50 mm. The results for the standard deviations (in microns) are shown in the table below:

z0mc < 50 mm
0 < phi < 0.05 0.05 < phi < 0.15 0.15 < phi < 0.35
ArCO2 48 +/- 4 53 +/- 3 92 +/- 6
P10 57 +/- 3 63 +/- 3 104 +/- 8

All of this suggests that there is not expected to be a significant track angle effect except for the largest phi bin.

Primary electron statistics
The resolution improves with larger number of primary electrons being sampled by the pads. For very large numbers of primary electrons, the resolution begins to degrade due to the presence of delta rays. Delta rays are not included in the MC simulation, however. The effects are seen in the (bsr-bxsr) distributions for ArCO2 data and MC, shown for all drift distances.
 
 
 
 
 
 
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